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PID Failure of c-Si and Thin-Film Modules and Possible Correlation with Leakage Currents

This PowerPoint presentation was originally presented at the NREL 2013 PV Module Reliability Workshop on Feb. 26-27, 2013 in Golden, CO. Presented by ZSW, it discussed PID failure of c-Si and thin-film modules, power degredation, the evaluation of leakage currents from the lab and the field, and recovery effects.